Please use this identifier to cite or link to this item: https://elib.belstu.by/handle/123456789/36128
Title: XRD Analysis of Synthetic Diamond Powders Irradiated with Electrons
Authors: Shishonok, E. M.
Luhin, V. G.
Koltunowiczb, T. N.
Keywords: powders of synthetic diamond
irradiated with high energy electrons
crystal lattice diamond distorted
X-ray diffraction
resistance crystal lattice against irradiation
Issue Date: 2015
Citation: XRD Analysis of Synthetic Diamond Powders Irradiated with Electrons / E. M. Shishonok, V. G. Luhin, T. N. Koltunowiczb // Acta Physica Polonica A. - 2015. - Vol. 128, № 5. - P. 912-914
Abstract: Powders of synthetic diamond with low strength were sorted on sets with a different grain size. The synthetic diamond sets had various crushing strengths and morphology. They were irradiated with high energy electrons (6.5 MeV, D = 2 x 1019 cm-2) and analyzed using X-ray diffraction (Cu Ka) before and after irradiation. As established from nonlinearity of the a(6) = f {R(&)} dependences and observed extra splittings in X-ray diffraction patterns (in addition to a1-a2 doublets), crystal lattice of synthetic diamond from different sets was variously distorted. Irradiation led to decreasing distortions more significantly, the higher the initial strength of the set was. The made conclusions coincide well with our previous results on synthetic diamond powders which were irradiated under various softer conditions with direct measurements of synthetic diamond crushing strength without X-ray diffraction analysis. X-ray diffraction allows to presort synthetic diamond of critically low relative mechanical strength as well as evaluate resistance of diamond crystal lattice against heavy irradiation and other external impacts.
URI: https://elib.belstu.by/handle/123456789/36128
Appears in Collections:Публикации в зарубежных изданиях

Files in This Item:
File Description SizeFormat 
20.pdf840.53 kBAdobe PDFView/Open



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.